Nanometer-scale Defect Detection Using Polarized Light
(2016)

Nonfiction

eBook

Provider: hoopla

Details

PUBLISHED
[United States] : Wiley, 2016
Made available through hoopla
DESCRIPTION

1 online resource

ISBN/ISSN
9781119329688 MWT18086464, 111932968X 18086464
LANGUAGE
English
NOTES

This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale

Mode of access: World Wide Web

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